Posted on November 3, 2004October 12, 2022Sinusoidal phase grating created by a tunably buckled surface
Posted on July 11, 2004October 12, 2022A buckling-based metrology for measuring the elastic moduli of polymeric thin films
Posted on January 5, 2004October 12, 2022Finite-size effects on surface segregation in polymer blend films above and below the critical point of phase separation
Posted on January 2, 2004October 12, 2022Scattering measurements for high throughput materials science research
Posted on January 1, 2004October 12, 2022A rapid prototyping technique for the fabrication of solvent-resistant structures
Posted on December 1, 2003October 12, 2022Techniques for combinatorial and high-throughput microscopy Part 2: Automated optical microscopy platform for thin film research
Posted on August 21, 2003October 12, 2022Influence of layered silicates on the phase-separated morphology of PS−PVME blends
Posted on August 1, 2003October 12, 2022Techniques for combinatorial and high-throughput microscopy Part 1: Gradient specimen fabrication for poiymer thin film research
