Skip to content

Karim Research Group

Sustainable materials, nanomaterials for energy, directed self-assembly and phase behavior

  • Overview
  • Research
    • Research Introduction
    • Materials for a Sustainable Future
    • Nanomaterials for Energy
    • Directed Self-assembly and Phase Behavior
  • Alamgir Karim
  • Facilities
  • Join Us
  • People
  • Publications
Posted on January 15, 2003October 12, 2022 by Justin

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high-throughput characterization of biosurfaces

CategoriesJournal Articles, Publications

Post navigation

Previous PostPrevious Combinatorial investigation of dewetting: polystyrene thin films on gradient hydrophilic surfaces
Next PostNext Combinatorial mapping of surface energy effects on diblock copolymer thin film ordering